The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2015

Filed:

Nov. 30, 2010
Applicants:

Han Wen, Bethesda, MD (US);

Vinay M. Pai, Potomac, MD (US);

Inventors:

Han Wen, Bethesda, MD (US);

Vinay M. Pai, Potomac, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
G06T 5/50 (2013.01); G06T 2207/10088 (2013.01); G06T 2207/20021 (2013.01);
Abstract

An apparatus and method are disclosed for improving imaging based on a time-series of images. In one embodiment, a time-series of images are acquired using a same imaging protocol of the same subject area, but the images are spaced in time by one or more time intervals (e.g, 1, 2, 3 . . . seconds apart). A sub-region is projected across all of the images to perform a localized analysis (corresponding X-Y pixels or X-Y-Z voxels are analyzed across all images) that identifies temporal components within each sub-region. In some of the sub-regions, the temporal components are removed when the amplitude of the component is below a predetermined amplitude threshold. The images are then combined using the sub-regions with reduced components in order to obtain a single image with reduced noise.


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