The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2015

Filed:

Feb. 01, 2012
Applicants:

Frank Dennerlein, Forchheim, DE;

Oliver Hornung, Fürth, DE;

Markus Kowarschik, Langenzenn, DE;

Inventors:

Frank Dennerlein, Forchheim, DE;

Oliver Hornung, Fürth, DE;

Markus Kowarschik, Langenzenn, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01); A61B 6/03 (2006.01); G01D 18/00 (2006.01); A61B 6/00 (2006.01); G06T 11/00 (2006.01); A61B 6/02 (2006.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); A61B 6/032 (2013.01); A61B 6/035 (2013.01); A61B 6/583 (2013.01); G01N 2223/3303 (2013.01); A61B 6/027 (2013.01); A61B 6/4452 (2013.01); A61B 6/4458 (2013.01); A61B 6/584 (2013.01); G06T 11/005 (2013.01);
Abstract

A method for obtaining a 3D image dataset of an object of interest is proposed. A plurality of 2D X-ray images are captured and a 3D reconstruction is carried out using filtered back projection. The projection parameters have been measured with the aid of a calibrating phantom, possibly using an interpolation or extrapolation of such measurements. A model of effect strings of the components in an X-ray imaging device is obtained, and the model parameters are identified based on imaging of a calibrating phantom. A projection matrix can then be calculated for any positions on any desired trajectories, without having to use imaging of a calibrating phantom at precisely that position and desired trajectory.


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