The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2015

Filed:

Mar. 13, 2013
Applicant:

Exelis, Inc., McLean, VA (US);

Inventors:

Eugene Olczak, Pittsford, NY (US);

Cormic Merle, Rochester, NY (US);

Greg Burdick, Rochester, NY (US);

Assignee:

Exelis, Inc., McLean, VA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/021 (2006.01); G02B 5/32 (2006.01); G01M 11/02 (2006.01);
U.S. Cl.
CPC ...
G01B 9/021 (2013.01); G02B 5/32 (2013.01); G01M 11/0271 (2013.01);
Abstract

An apparatus for testing an optical surface comprising an array of holograms. The array includes a plurality of individual holograms arranged in an M×N format, in which M is the number of rows and N is the number of columns in the array. The array of holograms is positioned between the optical surface and a wavefront sensor. The array of holograms reflects a reference beam back to the wavefront sensor, and transmits a test beam to the optical surface. The array of holograms also receives the test beam reflected from the optical surface and transfers the test beam back to the wavefront sensor.


Find Patent Forward Citations

Loading…