The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2015
Filed:
Feb. 23, 2011
Kunihiko Nagamine, Kanagawa, JP;
Satoshi Tomioka, Kanagawa, JP;
Kunihiko Nagamine, Kanagawa, JP;
Satoshi Tomioka, Kanagawa, JP;
Sony Corporation, Tokyo, JP;
Abstract
A color-unevenness inspection apparatus includes: an image pickup section picking up an image of an inspection target in a color-unevenness inspection; and an image generation section generating an uneven-color image by, in the picked-up image of the inspection target obtained by the image pickup section, calculating a chroma in each unit region and identifying an uneven-color region based on a magnitude of the calculated chroma. The color-unevenness inspection apparatus further includes: a calculation section calculating, for the uneven-color region in the uneven-color image, an evaluation parameter to be used in the color-unevenness inspection; and an inspection section performing the color-unevenness inspection based on the calculated evaluation parameter. The image generation section calculates the chroma, in each unit region of the picked-up image, while performing correction processing that reflects variations in color-unevenness visibility from color to color.