The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2015

Filed:

Dec. 03, 2013
Applicant:

Access Medical Systems, Ltd., Palo Alto, CA (US);

Inventors:

Hong Tan, San Jose, CA (US);

Yushan Tan, Shanghai, CN;

Erhua Cao, Shanghai, CN;

Ming Xia, Shanghai, CN;

Robert F. Zuk, Menlo Park, CA (US);

Assignee:

Access Medical Systems, Ltd., Palo Alto, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01B 9/02 (2006.01); G02B 6/26 (2006.01); G02B 6/36 (2006.01); G01N 21/45 (2006.01); G01N 21/77 (2006.01); G02B 6/00 (2006.01); G01N 21/63 (2006.01);
U.S. Cl.
CPC ...
G01N 21/45 (2013.01); G01N 21/7703 (2013.01); G02B 6/262 (2013.01);
Abstract

The present invention is directed to an assembly for use in detecting an analyte in a sample based on thin-film spectral interference. The assembly comprises a waveguide, a monolithic substrate optically coupled to the waveguide, and a thin-film layer directly bonded to the sensing side of the monolithic substrate. The refractive index of the monolithic substrate is higher than the refractive index of the transparent material of the thin-film layer. A spectral interference between the light reflected into the waveguide from a first reflecting surface and a second reflecting surface varies as analyte molecules in a sample bind to the analyte binding molecules coated on the thin-film layer.


Find Patent Forward Citations

Loading…