The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2015

Filed:

Jan. 02, 2012
Applicants:

Nelly Rongeat, Grables, FR;

Philippe Nerin, Montferrier sur Lez, FR;

Patrick Brunel, Saint Aunes, FR;

Inventors:

Nelly Rongeat, Grables, FR;

Philippe Nerin, Montferrier sur Lez, FR;

Patrick Brunel, Saint Aunes, FR;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/06 (2006.01); G01N 33/00 (2006.01); G01N 33/48 (2006.01); G01N 21/64 (2006.01); G01N 15/10 (2006.01); G01N 15/14 (2006.01); G02B 27/09 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6486 (2013.01); G01N 15/1031 (2013.01); G01N 15/1427 (2013.01); G02B 27/0927 (2013.01); G01N 2015/1037 (2013.01); G01N 2015/1477 (2013.01); G01N 2015/1486 (2013.01);
Abstract

A device for inspecting a biological fluid, including a channel through which the fluid flows, a first inspection module arranged in a first region of the channel, and a second inspection module arranged in a second region of the channel, the device configured to provide a quantity that is representative of output of the second inspection module. The first inspection module is configured to measure at least one electrical property of the fluid passing through the first region. The second inspection module is configured to measure at least one optical property of the fluid passing through the second region. The inspection device also includes a controller connected to the first inspection module and to the second inspection module and configured to control the second inspection module according to the output of the first inspection module.


Find Patent Forward Citations

Loading…