The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2015
Filed:
Sep. 13, 2011
Applicant:
Gert Koest, Hannover, DE;
Inventor:
Gert Koest, Hannover, DE;
Assignee:
Oculus Optikgeraete GmbH, Wetzlar Dutenhofen, DE;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/16 (2006.01); A61B 3/10 (2006.01); A61B 3/107 (2006.01);
U.S. Cl.
CPC ...
A61B 3/165 (2013.01); A61B 3/1005 (2013.01); A61B 3/107 (2013.01);
Abstract
The invention relates to an ophthalmic analysis system for measuring the intraocular pressure in an eye comprising an actuating device for contact-free deformation of the cornea, an observation system with which the deformation of the cornea can be observed and recorded, an analysis device with which the intraocular pressure can be deduced from the image information of the observation system, wherein split images of at least parts of the undeformed and/or deformed cornea can be recorded using the observation system.