The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2015

Filed:

Mar. 12, 2013
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Jun Yasutani, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 29/38 (2006.01); B41J 2/045 (2006.01); B41J 2/14 (2006.01);
U.S. Cl.
CPC ...
B41J 2/0458 (2013.01); B41J 2/0454 (2013.01); B41J 2/04543 (2013.01); B41J 2/04563 (2013.01); B41J 2/04568 (2013.01); B41J 2/04573 (2013.01); B41J 2/04588 (2013.01); B41J 2/0459 (2013.01); B41J 2/04591 (2013.01); B41J 2/04598 (2013.01); B41J 2/14072 (2013.01);
Abstract

By performing an average process of a result of a plurality of times of samplings by the temperature sensor provided on a printing element substrate, temperature of the printing element substrate is obtained. In this case, the number of times of samplings is determined on the basis of a simultaneously driven number in the printing element substrate. This enables the number of times of samplings for the temperature sensor to be determined depending on a simultaneously driven number at each time, and therefore while suppressing an influence of noise, the temperature of the printing element substrate can be measured in a highly reliable state where there is no separation from an actual temperature.


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