The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2015

Filed:

Feb. 16, 2010
Applicants:

Hiroyuki Tanaka, Halstenbek, DE;

Hiroo Tatsutani, Kobe, JP;

Inventors:

Hiroyuki Tanaka, Halstenbek, DE;

Hiroo Tatsutani, Kobe, JP;

Assignee:

Sysmex Corporation, Kobe, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 35/02 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/026 (2013.01); G01N 35/00603 (2013.01); G01N 2015/0065 (2013.01);
Abstract

An analyzing apparatus comprising: a transporting device for transporting a sample; a plurality of measuring units, each measuring unit measuring a sample transported by the transporting device; a determination result obtainer for obtaining a determination result representing whether the sample requires remeasurement based on a measurement result by a predetermined measuring unit among the plurality of measuring units; a designation receiver for receiving a designation of one measuring unit for remeasuring the sample determined to be remeasured; and a transport controller for controlling the transporting device so as to transport the sample determined to be remeasured to the designated measuring unit. An analyzing method is also disclosed.


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