The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2015
Filed:
Oct. 02, 2009
Applicants:
Toshikatsu Sakai, Kyoto, JP;
Akira Sezaki, Kyoto, JP;
Takeshi Takagi, Kyoto, JP;
Inventors:
Assignee:
ARKRAY, Inc., Kyoto-shi, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 30/16 (2006.01); G01N 30/20 (2006.01); G01N 30/18 (2006.01); G01N 30/86 (2006.01); G01N 30/04 (2006.01);
U.S. Cl.
CPC ...
G01N 30/20 (2013.01); G01N 30/18 (2013.01); G01N 30/8665 (2013.01); G01N 30/8658 (2013.01); G01N 2030/042 (2013.01); G01N 2030/201 (2013.01); G01N 2030/202 (2013.01); G01N 2030/207 (2013.01);
Abstract
An analyzing device includes a feeder connected to a container in which a sample is contained for sucking the sample from the container and feeding the sample, and a controller for performing control for feeding from the feeder to a measurer. In measuring the sample, the controller performs control so that results of a plurality of times of measurement are obtained with respect to the single container in which the sample is contained, without changing the container. This arrangement allows quick accuracy check.