The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2015
Filed:
Jul. 20, 2011
David Roberts Mcmurtry, Dursley, GB;
Geoff Mcfarland, Dursley, GB;
Kenneth Cheng-hoe Nai, Bristol, GB;
Stephen James Trull, Wickwar, GB;
Nicholas John Weston, Peebles, GB;
David Roberts McMurtry, Dursley, GB;
Geoff McFarland, Dursley, GB;
Kenneth Cheng-Hoe Nai, Bristol, GB;
Stephen James Trull, Wickwar, GB;
Nicholas John Weston, Peebles, GB;
Renishaw PLC, Wotton-Under-Edge, GB;
Abstract
A method of calibrating an articulating probe head comprising the steps of measuring an artifact of known dimensions with the workpiece sensing probe mounted on the articulating probe head, in which the articulating probe head is unlocked. An error functional map is generated corresponding to the difference between the measured and known dimensions of the artifact. Subsequent workpieces are measured with the articulating probe head unlocked and the corresponding correction applied. The true dimensions of the artifact may be determined by measuring it with a probe mounted on an articulating probe head in which the axes of the articulating probe head are locked. A mechanical lock is provided to lock the axes of the articulating probe head.