The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2015

Filed:

Dec. 09, 2010
Applicants:

Kosuke Nishihara, Tokyo, JP;

Kazuhisa Ishizaka, Tokyo, JP;

Inventors:

Kosuke Nishihara, Tokyo, JP;

Kazuhisa Ishizaka, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/46 (2006.01); G06F 9/50 (2006.01);
U.S. Cl.
CPC ...
G06F 9/50 (2013.01);
Abstract

A parameter determination unitsubstitutes, for each of a plurality of applications, a recommended amount of resources and a quality of experience corresponding to the recommended amount of resources, and a minimum amount of resources and a quality of experience corresponding to the minimum amount of resources into a quality function f in expression (1) indicating a relation between an amount of resources R and a quality of experience Q, to determine parameters a and b. A resource amount determination unitdetermines an amount of resources to be allocated to the plurality of applications using the quality function f for each application in which the parameters a and b are determined. The quality function f(x) is a monotonically increasing function having an inverse function f, connects (−∞,0) and (+∞,1), and is symmetrical with respect to x=0.()=(()/)  (1)


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