The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2015
Filed:
Oct. 12, 2010
David Brooke Martin, San Jose, CA (US);
Marco Gagliardi, Brisbane, CA (US);
Mark Jacob Addleman, San Francisco, CA (US);
David Brooke Martin, San Jose, CA (US);
Marco Gagliardi, Brisbane, CA (US);
Mark Jacob Addleman, San Francisco, CA (US);
CA, Inc., New York, NY (US);
Abstract
A two-pass technique for instrumenting an application is disclosed. One pass may be performed statically by analyzing the application and inserting probes while the application is not running. Another pass may be performed dynamically by analyzing data collected by the probes while the application runs to derive metrics for the probes. One or more metrics for each probe may be analyzed to determine whether to dynamically modify the probe. By dynamically modifying the probe, the application does not need to be shut down. Dynamically modifying the probe could include removing the probe from the application or moving the probe to another component (e.g., method) in the application, as examples. For example, the probe might be moved to a component that is either up or down the call graph from the component that the probe is presently in.