The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2015
Filed:
Apr. 04, 2014
Bio-rad Laboratories, Inc., Hercules, CA (US);
Curtis Alan Parvin, McKinney, TX (US);
John C. Yundt-Pacheco, Fairview, TX (US);
Bio-Rad Laboratories, Inc., Hercules, CA (US);
Abstract
A method analyzes a quality control strategy. A quality control rule can define quality control events and specifying a control limit for determining whether a quality control event passes or fails. The quality control rule and a number of patient samples tested between quality control events can be received. A first expected number of correctible errors when a quality control event fails can be computed based on the quality control rule and the number of patient samples tested between quality control events. A second expected number of final errors that are not correctible when a quality control event fails can be computed based on the quality control rule and the number of patient samples tested between quality control events. An assessment of the quality control rule can include the first expected number of correctible errors and the second expected number of final errors as separate values.