The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2015
Filed:
Nov. 29, 2011
Andrea L. Bertozzi, Santa Monica, CA (US);
Laura M. Smith, Los Angeles, CA (US);
Matthew S. Keegan, Los Angeles, CA (US);
Todd Wittman, Los Angeles, CA (US);
George O. Mohler, San Jose, CA (US);
Andrea L. Bertozzi, Santa Monica, CA (US);
Laura M. Smith, Los Angeles, CA (US);
Matthew S. Keegan, Los Angeles, CA (US);
Todd Wittman, Los Angeles, CA (US);
George O. Mohler, San Jose, CA (US);
The Regents of the University of California, Oakland, CA (US);
Abstract
Systems and methods are disclosed for generating a probability density to estimate the probability that an event will occur in a region of interest. The methods input spatial event data comprising one or more events occurring in the region of interest along with auxiliary data related to the region of interest. The auxiliary data comprises non-event data having spatial resolution such that the probability density estimate for the region of interest is calculated based on a function of the auxiliary data and the event data. In particular, the auxiliary data is used to generate a penalty functional used in the calculation of the probability density estimate.