The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2015

Filed:

May. 26, 2010
Applicants:

Yasuhiro Higashi, Miyagi, JP;

Kazuhiro Harasaka, Miyagi, JP;

Inventors:

Yasuhiro Higashi, Miyagi, JP;

Kazuhiro Harasaka, Miyagi, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 2/45 (2006.01); H01S 5/00 (2006.01); H01S 5/183 (2006.01); H01S 5/42 (2006.01); H04N 1/024 (2006.01); H01S 5/028 (2006.01); H01S 5/042 (2006.01); H01S 5/32 (2006.01); H01S 5/343 (2006.01);
U.S. Cl.
CPC ...
H01S 5/0042 (2013.01); H01S 5/18313 (2013.01); H01S 5/18333 (2013.01); H01S 5/18338 (2013.01); H01S 5/423 (2013.01); H04N 1/024 (2013.01); H01S 5/18355 (2013.01); H01S 2301/166 (2013.01); H01S 5/0282 (2013.01); H01S 5/0425 (2013.01); H01S 5/1835 (2013.01); H01S 5/3202 (2013.01); H01S 5/3434 (2013.01); H01S 5/3436 (2013.01); H01S 2301/176 (2013.01);
Abstract

A method of manufacturing a surface-emitting laser element having a light-emitting mesa structure with an emitting area including a high-reflectance portion and a low-reflectance portion includes forming a layered body that includes a lower reflecting mirror, a cavity structure, and an upper reflecting mirror on a substrate; forming a first area on an upper surface of the layered body; forming a second area having the same size as the first area on the upper surface of the layered body; forming a light-emitting mesa structure and a monitoring-mesa structure by etching the first area and the second area, respectively; forming a confinement structure including a current passage area surrounded by an oxide in the light-emitting mesa structure and the monitoring-mesa structure; and measuring the size of the current passage area of the monitoring-mesa structure.


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