The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2015
Filed:
Sep. 05, 2012
Ulrich Benner, Trostberg, DE;
Ulrich Benner, Trostberg, DE;
Dr, Johannes Heidenhain GmbH, Traunreut, DE;
Abstract
A rotary position measuring instrument that includes a light source and a graduated disk having a measuring standard. The rotary position measuring instrument including an optoelectronic detector assembly, wherein the graduated disk is rotatable relative to the light source and the detector assembly about an axis of rotation, wherein rotary-angle-dependent position signals are detectable via the detector assembly. The light source is spaced apart from the measuring standard by a first distance, and the detector assembly is disposed at a second distance from the measuring standard, wherein the second distance is different than the first distance. The graduated disk includes an optical element, which has an optical effect that results in a projecting an image of the light source into a position which has a third distance from the measuring standard, wherein the third distance is different than the first distance.