The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2015

Filed:

Nov. 15, 2011
Applicants:

Makoto Fujimaki, Ibaraki, JP;

Shoji Akiyama, Gunma, JP;

Kazutoshi Nagata, Gunma, JP;

Inventors:

Makoto Fujimaki, Ibaraki, JP;

Shoji Akiyama, Gunma, JP;

Kazutoshi Nagata, Gunma, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2014.01);
U.S. Cl.
CPC ...
G01N 21/553 (2013.01);
Abstract

A detection device is disclosed which includes: a detection plate in which a silicon layer and a silicon oxide layer are arranged in this order on a silica glass substrate; and optical prism which is optically adhered to a surface of the silica glass substrate of the detection plate, where the surface is not provided with the silicon layer and the silicon oxide layer; a light-irradiation unit configured to irradiate light to the detection plate through the optical prism and arranged so that light is incident on the optical prism with a fixed incident angle; and a light-detection unit configured to detect intensity of reflected light reflected from the detection plate, wherein the detection device detects a change in dielectric constant by detecting a change in property of the reflected light.


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