The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2015
Filed:
Dec. 10, 2013
International Business Machines Corporation, Armonk, NY (US);
Andreas Arp, Nufringen, DE;
Guenther Hutzl, Sindelfingen, DE;
Michael Koch, Ehningen, DE;
Matthias Ringe, Tuebingen, DE;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for detecting rising and falling transitions of internal signals of an array or integrated circuit. An apparatus used in the method comprises a delay line with a plurality of first to Nth delay elements, latches, and first to Nth groups of logic gates. Each of the first to Nth groups of the logical gates includes an AND gate and a NOR gate. The method determines rising and falling signals based on output signals of the logic gates in the apparatus; in odd numbered groups of the logic gates, the AND gate detects the rising transition and the NOR gate detects the falling transition; in even numbered groups of the logic gates, the AND gate detects the falling transition and the NOR gate detects the rising transition.