The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2015
Filed:
Feb. 08, 2013
Fujifilm Corporation, Tokyo, JP;
Masashi Ueshima, Kanagawa, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
An aspect of a recording defect inspection method for an image recording apparatus includes: a recording step of sequentially recording test patterns of respective recording heads onto a recording medium, an image capturing step of capturing an image of a test pattern recorded on the recording medium by means of a scanner, an analysis step of analyzing the captured test pattern and detecting a recording defect of the recording head which has recorded the test pattern, an evaluation frequency setting step of setting an evaluation frequency for each of the recording heads on the basis of a recording defect occurrence frequency for each recording head, and a control step of setting a frequency of each of the recording heads in the test patterns to the set evaluation frequency.