The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2015

Filed:

Apr. 07, 2010
Applicants:

Andrew David Bonner, Thornton, CO (US);

Scott M Airhart, Arvada, CO (US);

Scott Bacon, Thornton, CO (US);

Brandon J. Rodgers, Arvada, CO (US);

Inventors:

Andrew David Bonner, Thornton, CO (US);

Scott M Airhart, Arvada, CO (US);

Scott Bacon, Thornton, CO (US);

Brandon J. Rodgers, Arvada, CO (US);

Assignee:

Sybase, Inc., Dublin, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/177 (2006.01); G06F 17/00 (2006.01); H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
H04L 67/1095 (2013.01);
Abstract

System, method, computer program product embodiments and combinations and sub-combinations thereof for data replication tracing are provided. In an embodiment, the data replication tracing includes identifying a replication environment within a multi-tier infrastructure of an enterprise data processing network, and monitoring operational performance within the replication environment. A path is rendered on a topology to display data flow for the replication environment based upon a configuration of the replication environment. The data flow may be represented relative to a target data node, relative to a source data node, and/or relative to a replication server.


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