The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2015

Filed:

Mar. 23, 2012
Applicants:

Nikhil Girish Patwardhan, Pune, IN;

Ashim Roy, Pune, IN;

Moksha Suryakant Jivane, Pune, IN;

Varsha Jagtap, Pune, IN;

Eeti Sancheti, Pune, IN;

Nandita Babu, Mumbai, IN;

Inventors:

Nikhil Girish Patwardhan, Pune, IN;

Ashim Roy, Pune, IN;

Moksha Suryakant Jivane, Pune, IN;

Varsha Jagtap, Pune, IN;

Eeti Sancheti, Pune, IN;

Nandita Babu, Mumbai, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods for test data generation are described. In one implementation, the method includes receiving seed data having one or more characteristics. Further, the method includes obtaining a selection criterion indicating a selected portion of the seed data to be transformed. Based on the selection criterion, the seed data is transformed for at least a plurality of iterations to generate test data. The test data comprise a plurality of data sets including a primary data set generated in a first iteration and a secondary data set generated in each subsequent iteration. The primary data set includes transformed data corresponding to the selected portion of the seed data and non-transformed data corresponding to a remaining portion of the seed data and each secondary data set includes transformed data corresponding to the selected portion of the seed data.


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