The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2015
Filed:
Feb. 14, 2013
Pranav Wankawala, Sunnyvale, CA (US);
Yingyu Chen, Shanghai, CN;
Hermann Lueckhoff, Sunnyvale, CA (US);
Jun Shi, Palo Alto, CA (US);
Pranav Wankawala, Sunnyvale, CA (US);
Yingyu Chen, Shanghai, CN;
Hermann Lueckhoff, Sunnyvale, CA (US);
Jun Shi, Palo Alto, CA (US);
SAP SE, Walldorf, DE;
Abstract
Disclosed is system for monitoring data changes during a data replication process. The system includes a modeling module configured to select tables and fields to be monitored during execution of the data replication process, a trigger module configured to track changes of data being generated during execution of a program by inserting triggers into a destination system at the start of a program execution and then dropping the trigger at the end of program execution, a snapshot module configured to track changes of data being generated during execution of a program by generating a snapshot of data at the beginning and the end of program execution, and a report module configured to generate a report indicating changes in data based on the changes in data indicated by the triggers and based on the changes in data indicated by the snapshots of data.