The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2015
Filed:
Mar. 09, 2012
Walter Luis Tercariol, Campinas, BR;
Richard T. L. Saez, Campinas, BR;
Fernando Zampronho Neto, Jacarei, BR;
Ivan Carlos Ribeiro Nascimento, Campinas, BR;
Walter Luis Tercariol, Campinas, BR;
Richard T. L. Saez, Campinas, BR;
Fernando Zampronho Neto, Jacarei, BR;
Ivan Carlos Ribeiro Nascimento, Campinas, BR;
Freescale Semiconductor, Inc., Austin, TX (US);
Abstract
A testing circuit in an integrated circuit indirectly measures a voltage at a node of other circuitry in the integrated circuit. The testing circuit includes a transistor having a control electrode, a first conducting electrode coupled to a first pad, a second conducting electrode coupled to a terminal of a power supply, and one or more switches for selectively coupling the control electrode to one of the node and a second pad. A method includes determining a relationship between drain current and gate voltage of the transistor when the control electrode is coupled to the second pad. A voltage at the node is determined by relating the current through the first conducting electrode of the transistor when control electrode is coupled to the node.