The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2015

Filed:

Mar. 05, 2012
Applicants:

Weizhen Yan, Beijing, CN;

Zhenning Tao, Beijing, CN;

Takeshi Hoshida, Kawasaki, JP;

Inventors:

Weizhen Yan, Beijing, CN;

Zhenning Tao, Beijing, CN;

Takeshi Hoshida, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); H04B 10/255 (2013.01); H04B 10/69 (2013.01);
U.S. Cl.
CPC ...
H04B 10/255 (2013.01); H04B 10/6971 (2013.01);
Abstract

A method and apparatus for compensating nonlinear damage are disclosed. The method for compensating nonlinear damage, including: determining an additive parameter indicating an amount of nonlinear damage based on a plurality of sampled signal sets among which a sampling time of an input signal varies according to different time; and subtracting the additive parameter from the input signal.


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