The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2015
Filed:
Apr. 25, 2011
Guangjun Zhang, Beijing, CN;
Zhenzhong Wei, Beijing, CN;
Weixian LI, Beijing, CN;
Zhipeng Cao, Beijing, CN;
Yali Wang, Beijing, CN;
Guangjun Zhang, Beijing, CN;
Zhenzhong Wei, Beijing, CN;
Weixian Li, Beijing, CN;
Zhipeng Cao, Beijing, CN;
Yali Wang, Beijing, CN;
Beihang University, Beijing, CN;
Abstract
The present disclosure provides a microscopic vision measurement method based on the adaptive positioning of the camera coordinate frame which includes: calibrating parameters of a microscopic stereo vision measurement model (); acquiring pairs of synchronical images and transmitting the acquired images to a computer through an image acquisition card (); calculating 3D coordinates of feature points in a scene according to the matched pairs of feature points in the scene obtained from the synchronical images and the calibrated parameters of the microscopic stereo vision measurement model (); and performing specific measurement according to the 3D coordinates of the feature points in the scene (). With the method, the nonlinearity of the objective function in the microscopic vision calibration optimization is effectively decreased and a better calibration result is obtained.