The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2015
Filed:
Aug. 08, 2011
Applicant:
Ian Andrew Maxwell, New South Wales, AU;
Inventor:
Ian Andrew Maxwell, New South Wales, AU;
Assignee:
BT Imaging Pty Ltd, Surry Hills, AU;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/46 (2006.01); G01N 21/95 (2006.01); H01L 31/18 (2006.01); H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4671 (2013.01); G01N 21/95 (2013.01); H01L 31/1876 (2013.01); G01N 21/9501 (2013.01); H01L 22/12 (2013.01); Y02E 10/50 (2013.01);
Abstract
Methods are presented for improved detection of persistent or systematic defects induced during the manufacture of a product. In particular, the methods are directed to the detection of defects induced systematically in the manufacture of photovoltaic cells and modules. Images acquired from a number of samples are combined, enhancing the systematic defects and suppressing random features such as variations in material quality. Once a systematic defect is identified, steps can be taken to locate and rectify its cause.