The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2015
Filed:
Dec. 05, 2012
Keyence Corporation, Osaka, JP;
Takashi Hirano, Osaka, JP;
Keyence Corporation, Osaka, JP;
Abstract
Inputs of a plurality of images constituting a group of images of items regarded as non-defective items are accepted and stored, and a defect threshold for detecting a defective portion of an inspection object and a determination threshold for making a non-defective/defective determination are set based on the plurality of stored images. A defective item image which is an image of an item determined as a defective item is previously stored and when an input of an image newly acquired by capturing an inspection object is accepted, non-defective item learning processing is performed by use of a plurality of stored images including the image whose input has been accepted, to at least reset the defect threshold. A defective portion is re-detected based on the reset defect threshold, to determine whether or not the stored defective item image is an image of a defective item based on the set determination threshold.