The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2015
Filed:
Sep. 21, 2010
Gopal Biligeri Avinash, Waukesha, WI (US);
Ananth P. Mohan, Waukesha, WI (US);
Saad Ahmed Sirohey, Waukesha, WI (US);
Zhongmin Steve Lin, Waukesha, WI (US);
Gopal Biligeri Avinash, Waukesha, WI (US);
Ananth P. Mohan, Waukesha, WI (US);
Saad Ahmed Sirohey, Waukesha, WI (US);
Zhongmin Steve Lin, Waukesha, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
A system and method for analyzing and visualizing a local feature of interest includes access of a clinical image dataset comprising clinical image data acquired from a patient, identification of a region of interest (ROI) from the clinical image dataset, and extraction of at least one local feature corresponding to the ROI. The system and method also include definition of a local feature dataset comprising data representing at least one local feature, access of a pre-computed reference dataset comprising image data representing an expected value of the at least one identified derived characteristic of interest, and comparison of the characteristic dataset to the pre-computed reference dataset. Further, the system and method include calculation of at least one deviation metric from the comparison and output of a visualization of the at least one deviation metric.