The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2015
Filed:
Sep. 17, 2010
Applicant:
Faycal Benayad-cherif, Lexington, MA (US);
Inventor:
Faycal Benayad-Cherif, Lexington, MA (US);
Assignee:
Videojet Technologies Inc., Wood Dale, IL (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/60 (2006.01); G06K 9/20 (2006.01);
U.S. Cl.
CPC ...
G06T 7/602 (2013.01); G03T 7/0004 (2013.01); G06K 9/2036 (2013.01); G06T 2207/20221 (2013.01);
Abstract
A method of measuring an outline of a feature on a surface includes providing a substrate. The substrate includes a feature on a surface of the substrate. The feature includes walls. The surface of the substrate is illuminated. Edges of the walls are illuminated to measure a first contour and a second contour of the feature. An outline of the feature is calculated based on the first contour and the second contour.