The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2015

Filed:

Mar. 28, 2012
Applicants:

Yihong Qi, Santa Clara, CA (US);

Hongyuan Zhang, Fremont, CA (US);

Inventors:

Yihong Qi, Santa Clara, CA (US);

Hongyuan Zhang, Fremont, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 27/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems, methods, and other embodiments associated with detecting an event are described. According to one embodiment, a device includes a detect logic that is configured to, during a sample window, monitor a communication channel for an event in a signal, wherein monitoring the communication channel for the event includes incrementing a counter in response to a magnitude of the communication channel being greater than a first predetermined threshold, and provide a detection signal in response to the counter reaching a second predetermined threshold, wherein the detection signal indicates detection of the event in the signal.


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