The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2015

Filed:

Dec. 16, 2011
Applicants:

Seung-woo Lee, Daejeon-si, KR;

Bhum-cheol Lee, Daejeon-si, KR;

Jung-hee Lee, Daejeon-si, KR;

Inventors:

Seung-Woo Lee, Daejeon-si, KR;

Bhum-Cheol Lee, Daejeon-si, KR;

Jung-Hee Lee, Daejeon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04J 3/06 (2006.01);
U.S. Cl.
CPC ...
H04J 3/0697 (2013.01);
Abstract

An apparatus includes a difference extraction unit to extract a difference between a second time stamp value, which is obtained by adjusting a first time stamp value that is measured at a time of arrival of a synchronization message transmitted by the master at a Layer 3 to be synchronized in frequency with a clock of the master, and a third time stamp value, which is measured at a time of departure of the synchronization message from the master; a minimum filter to select a minimum from one or more difference values extracted by the difference extraction unit; and a delay variation calculation unit to estimate a time of arrival of a current synchronization message at the Layer 3 based on the selected minimum and calculate a delay variation.


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