The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2015

Filed:

Jul. 05, 2012
Applicants:

Abdelkader Medles, Royston, GB;

Cyril Valadon, Letchworth Garden City, GB;

Inventors:

Abdelkader Medles, Royston, GB;

Cyril Valadon, Letchworth Garden City, GB;

Assignees:

MStar Semiconductor, Inc., , TW;

MStar Semiconductor, Inc., Grand Cayman, KY;

MStar France SAS, Issy les Moulineaux, FR;

MStar Software R&D (Shenzhen) Ltd., Shenzhen, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04J 1/16 (2006.01); H04J 3/14 (2006.01); H04L 1/00 (2006.01); H04L 12/56 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques are provided for a radio link quality monitoring method and apparatus wherein a given user equipment device receives a plurality of Orthogonal Frequency Division Multiplex symbols that comprise a plurality of resource elements distributed in time and frequency, and which include reference symbols. The objective of the radio link quality monitoring is to predict the user equipment detection probability of control messages transmitted by the base station. The radio link quality estimation process calculates two average signal to noise ratio values over the complete frequency bandwidth for two assumed control channel formats corresponding to in-sync and out-of-sync conditions. The results of the calculations are then used to deduce the average error probabilities that are compared with predefined thresholds to provide the in-sync/out-of-sync indications.


Find Patent Forward Citations

Loading…