The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2015
Filed:
Aug. 30, 2011
Dan Pei, Jersey City, NJ (US);
Ashley Flavel, Seattle, WA (US);
Zihui GE, Madison, NJ (US);
Alexandre Gerber, Madison, NJ (US);
Hiren Shah, Morristown, NJ (US);
He Yan, Berkeley Heights, NJ (US);
Dan Pei, Jersey City, NJ (US);
Ashley Flavel, Seattle, WA (US);
Zihui Ge, Madison, NJ (US);
Alexandre Gerber, Madison, NJ (US);
Hiren Shah, Morristown, NJ (US);
He Yan, Berkeley Heights, NJ (US);
AT&T Intellectual Property I, L.P., Atlanta, GA (US);
Abstract
Methods, apparatus and articles of manufacture for hierarchical anomaly localization and prioritization are disclosed. An example method disclosed herein comprises obtaining reported status for a plurality of nodes of a hierarchical topology, the reported status for a particular node being at least one of normal, abnormal or indeterminate, and determining a subset of root cause abnormal nodes, a root cause abnormal node included in the subset of root cause abnormal nodes having a total number of abnormal direct descendent nodes and indeterminate direct descendent nodes that is greater than a number of normal direct descendent nodes of the root cause abnormal node.