The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2015

Filed:

Jan. 30, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Albert M. Chu, Nashua, NH (US);

Daryl M. Seitzer, Essex Junction, VT (US);

Rohit A. Shetty, Essex Junction, VT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 29/08 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G11C 29/08 (2013.01); G06F 17/50 (2013.01);
Abstract

Aspects of the invention provide for a structure and method for determining a degree of process variation skew between a plurality of bit cells in a static random-access-memory (SRAM) column architecture. In one embodiment, a structure includes: a plurality of bit cells within a static random access memory (SRAM) column architecture; a digital-to-analog converter (DAC) connected to the bit cells through a pair of multiplexers; and a pre-charge circuit connected to the bit cells through the pair of multiplexers, wherein the DAC and the pre-charge circuit control and test the bit cells to determine a degree of process variation skew between each of the bit cells.


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