The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2015
Filed:
Dec. 09, 2011
Guochuan Huang, Shenzhen, CN;
Hao Jin, Shenzhen, CN;
Jianli Dai, Shenzhen, CN;
Shenzhen China Star Optoelectronics Technology Co., Ltd., Shenzhen, CN;
Abstract
The present invention discloses a method for smear measurement of display device and a device for smear measurement of display device which comprises the following steps: a flash with a moving pattern and an unmovable scale is played in the display device; the smear extent of the moving pattern is judged in accordance with the scale number occupied by the smear in the flash. The present invention plays a flash with a moving pattern and an unmovable scale in the display device and judges smear extent of the moving pattern in accordance with the scale number occupied by the smear in the flash, so that the smear can be quantified by scales and different scale numbers corresponding to different smear extents are formed, to accurately judge the smear extent by observing the scale number occupied by the smear, thereby effectively monitoring the product quality.