The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2015
Filed:
Jul. 03, 2012
Frederik Jan DE Bruijn, Eindhoven, NL;
Ruud Vlutters, Eindhoven, NL;
Harold Agnes Wilhelmus Schmeitz, Eindhoven, NL;
Tommaso Gritti, Eindhoven, NL;
Frederik Jan De Bruijn, Eindhoven, NL;
Ruud Vlutters, Eindhoven, NL;
Harold Agnes Wilhelmus Schmeitz, Eindhoven, NL;
Tommaso Gritti, Eindhoven, NL;
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
A system and method that measures an optical focus of a distant optical imaging system (EYE), in particular the ocular accommodation of a distant human subject. A luminous pattern of light (P, A) is projected by a projector (P) in focus (A) at a known focal plane (FPL) in front of the distant optical imaging system (EYE), and an image of the reflection of the pattern (A) on a sensor surface of the distant optical imaging system (EYE), for instance the retina of an eye, is recorded by a camera (CAM) having an optical axis (AXCAM) coinciding at least partly with or situated close to the optical axis (AXP) of the projection device (P). The sharpness of the luminous pattern (A) reflected from the sensor surface (retina) is determined.