The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2015

Filed:

Dec. 29, 2011
Applicants:

Robert Graham Cooks, West Lafayette, IN (US);

Guangtao LI, Carmel, IN (US);

Xin LI, West Lafayette, IN (US);

Zheng Ouyang, West Lafayette, IN (US);

Inventors:

Robert Graham Cooks, West Lafayette, IN (US);

Guangtao Li, Carmel, IN (US);

Xin Li, West Lafayette, IN (US);

Zheng Ouyang, West Lafayette, IN (US);

Assignee:

Purdue Research Foundation, West Lafayette, IN (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/28 (2006.01); H01J 49/26 (2006.01); H01J 49/42 (2006.01); H01J 49/04 (2006.01);
U.S. Cl.
CPC ...
H01J 49/42 (2013.01); H01J 49/0431 (2013.01); H01J 49/0459 (2013.01);
Abstract

The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides a system for analyzing a sample that includes a probe including a material connected to a high voltage source, a device for generating a heated gas, and a mass analyzer.


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