The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2015
Filed:
Jan. 14, 2011
Hyun Min Kim, Gwangju-si, KR;
DO Gyoon Kim, Seongnam-si, KR;
Jong Myeon Park, Incheon-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
A apparatus for analyzing sample to prevent a sample from being stuck to a surface of the apparatus for analyzing sample in the course of being injected into the apparatus for analyzing sample. The apparatus for analyzing sample includes a platform having a disk shape. The platform includes chambers and channels, a sample inlet hole which is formed in an outer surface the platform and through which a sample is injected into the platform; an opening which is formed in the outer surface of the platform and through which a residual of the sample, present on the outer surface of the platform around the sample inlet hole, is introduced into a receiving space isolated from the chambers and channels; and a barrier which is formed on the outer surface of the platform around a portion of the opening to prevent the residual of the sample from moving past the opening in a radial outward direction of the platform.