The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2015

Filed:

Jul. 31, 2008
Applicants:

Derek Williams, Santa Cruz, CA (US);

Gary Garnier, Los Gatos, CA (US);

Kent Stemer, Los Gatos, CA (US);

Paul Carlson, Santa Cruz, CA (US);

Inventors:

Derek Williams, Santa Cruz, CA (US);

Gary Garnier, Los Gatos, CA (US);

Kent Stemer, Los Gatos, CA (US);

Paul Carlson, Santa Cruz, CA (US);

Assignee:

Fluke Corporation, Everett, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B60R 1/00 (2006.01); F15D 1/00 (2006.01);
U.S. Cl.
CPC ...
F15D 1/00 (2013.01);
Abstract

An air purge apparatus and method is presented to protect an imaging system from contamination by particulate matter and other substances in the ambient environment. The apparatus is adapted to be placed adjacent to a viewing window, lens or optics of an imaging system and to provide a protective flow of air. The apparatus includes a curved surface to direct air from a first plenum toward an imaging path in front of the apparatus. The apparatus also includes one or more openings nearer the lens to direct air from a second plenum into the imaging path. The air from the first plenum entrains air from the second plenum and ambient air to create a fluid stream away from the viewing window, lens, or optics and may form a fluid barrier to reduce contamination of a volume of air in the imaging path of the imaging sensor.


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