The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2015
Filed:
Nov. 03, 2011
Hisanari Torii, Gamagori, JP;
Toshio Murata, Milpitas, CA (US);
Naoyuki Kondoh, Anjo, JP;
Nidek Co., Ltd., Gamagori, JP;
Abstract
A control method of a fundus examination apparatus configured to examine a fundus of an examinee's eye, includes: processing an examination data obtained by one of fundus examination apparatuses, which are a perimeter configured to measure a visual field and an optical coherence tomography device configured to obtain a tomographic image of the fundus, to thereby obtain positional information relating to an abnormal site of the fundus; setting an examination position on the fundus in the other fundus examination apparatus which is the perimeter or the optical coherence tomography device based on the positional information; and examining the abnormal site of the fundus by controlling the other fundus examination apparatus based on the set examination position.