The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2015
Filed:
Sep. 04, 2012
Fan Zhang, Milpitas, CA (US);
Ming Jin, Fremont, CA (US);
Wu Chang, Sunnyvale, CA (US);
Haitao Xia, San Jose, CA (US);
Fan Zhang, Milpitas, CA (US);
Ming Jin, Fremont, CA (US);
Wu Chang, Sunnyvale, CA (US);
Haitao Xia, San Jose, CA (US);
LSI Corporation, Milpitas, CA (US);
Abstract
An apparatus includes a low density parity check decoder operable to iteratively generate messages between a plurality of check nodes and variable nodes, and to calculate a fractional quality metric for a data block as it is decoded in the low density parity check decoder based at least in part on perceived values of data in the variable nodes. The fractional unsatisfied check quality metric is a probabilistic determination of a number of unsatisfied parity checks in the low density parity check decoder.