The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8930756 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 06, 2015

Filed:

Dec. 22, 2011
Applicants:

Mark A. Jerde, Rochester, MN (US);

Siobhan M. O'toole, Rochester, MN (US);

Inventors:

Mark A. Jerde, Rochester, MN (US);

Siobhan M. O'Toole, Rochester, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques are described for detecting the occurrence of error scenarios occurring across a plurality of nodes. Embodiments retrieve a plurality of error scenario profiles. Each of the error scenario profiles specifies prerequisite criteria, the prerequisite criteria including at least one of (i) one or more errors and (ii) one or more conditions. The plurality of nodes is monitored to detect errors occurring on nodes within the plurality of nodes. Embodiments then detect the occurrence of an error scenario, when at least a portion the monitored errors match the prerequisite criteria specified in a first one of the error profiles and when the one or more conditions specified in the first error profile are satisfied.


Find Patent Forward Citations

Jerde, Mark. (2015). Grouping related errors in a distributed computing environment (U.S. Patent No. 8930756). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8930756

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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