The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2015

Filed:

Dec. 06, 2011
Applicants:

Sreerupa Das, Oviedo, FL (US);

Ashis K. Maity, Oviedo, FL (US);

Inventors:

Sreerupa Das, Oviedo, FL (US);

Ashis K. Maity, Oviedo, FL (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06K 9/00 (2006.01); G06F 17/50 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00496 (2013.01); G06F 17/5036 (2013.01); G01R 31/2837 (2013.01);
Abstract

A method and device for extracting information from data representing a signal is disclosed. A set of data comprising a plurality of measurements of the signal generated at a first sampling rate is received from a sensor. A subset of the plurality of measurements is selected. A plurality of feature variables, each of which corresponds to a particular feature in a set of features that may be present in the signal are determined by deriving an underdetermined system of equations based on a selected basis function, the subset of the plurality of measurements, and the plurality of feature variables and corresponding features. The underdetermined system of equations is solved to determine a value for each feature variable using a non-linear optimization technique to minimize an Lnorm of the set of features. Feature information is stored in a storage medium.


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