The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2015
Filed:
Mar. 18, 2009
Makoto Katsukura, Tokyo, JP;
Masanori Nakata, Tokyo, JP;
Noriyuki Kushiro, Tokyo, JP;
Takeru Kuroiwa, Tokyo, JP;
Toshiyasu Higuma, Tokyo, JP;
Naoyuki Hibara, Tokyo, JP;
Yoshiaki Ito, Tokyo, JP;
Makoto Katsukura, Tokyo, JP;
Masanori Nakata, Tokyo, JP;
Noriyuki Kushiro, Tokyo, JP;
Takeru Kuroiwa, Tokyo, JP;
Toshiyasu Higuma, Tokyo, JP;
Naoyuki Hibara, Tokyo, JP;
Yoshiaki Ito, Tokyo, JP;
Mitsubishi Electric Corporation, Chiyoda-Ku, Tokyo, JP;
Abstract
An apparatus state detector and its associates are provided to save time and effort for learning combinations of operation states of all apparatuses at home and commit fewer estimation errors even when an unknown apparatus starts operating. The apparatus state detector includes measuring means that measures a physical quantity of an environment in which an apparatus is placed, feature-quantity calculation means that calculates a feature quantity of the measured value measured by the measuring means, storage means that stores in advance the feature quantity of each apparatus and an apparatus state associated with the feature quantity in a reference-apparatus entry dictionary, and apparatus-state detection means that searches the reference-apparatus entry dictionary for a feature quantity by using a feature quantity calculated by the feature-quantity calculation means as a search key and detects an apparatus state based on the apparatus state associated with the retrieved feature quantity.