The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2015
Filed:
Jul. 15, 2011
Applicants:
Jung Soon Jang, Bellevue, WA (US);
Jeong-beom Ihn, Bellevue, WA (US);
Inventors:
Jung Soon Jang, Bellevue, WA (US);
Jeong-Beom Ihn, Bellevue, WA (US);
Assignee:
The Boeing Company, Chicago, IL (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/00 (2006.01); G06F 11/00 (2006.01); G01N 29/265 (2006.01); G01N 29/22 (2006.01); G01N 29/24 (2006.01); G01N 29/44 (2006.01);
U.S. Cl.
CPC ...
G01N 29/265 (2013.01); G01N 29/225 (2013.01); G01N 29/2475 (2013.01); G01N 29/2481 (2013.01); G01N 29/2493 (2013.01); G01N 29/4427 (2013.01); G01N 29/4472 (2013.01); G01N 2291/0231 (2013.01); G01N 2291/106 (2013.01); G01N 2291/2694 (2013.01);
Abstract
A method and apparatus for inspecting an object is provided. Movement of inspection vehicles relative to a surface of the object is controlled using a controller. Generation of data about the object by sensor systems configured to generate the data when the sensor systems are in a configuration with respect to a location on the object for inspection and receiving power from the inspection vehicles is controlled using the controller. The data generated by the sensor systems is stored.