The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2015

Filed:

Nov. 26, 2010
Applicants:

Jerome Francois Knoplioch, Buc, FR;

Sylvie Jacquot-ingles, Buc, FR;

Cedric Hermel, Buc, FR;

Sine Rosalina Woye, Buc, FR;

Cathleen Cooper, Buc, FR;

Inventors:
Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 19/00 (2006.01);
U.S. Cl.
CPC ...
A61B 19/56 (2013.01); A61B 2019/461 (2013.01); A61B 2019/5289 (2013.01);
Abstract

A method of analyzing a structure-of-interest (SOI) in a patient. The method includes obtaining a first medical image of a patient. The first medical image includes an identified structure-of-interest (SOI). The identified SOI has a corresponding local measurement. The method also includes receiving a second medical image of the patient and selecting an SOI in the second medical image. The selected SOI has a corresponding local measurement. The method also includes automatically determining that the selected SOI is the identified SOI based on corresponding location data of the identified and selected SOIs, respectively, and linking the local measurements of the selected and identified SOI.


Find Patent Forward Citations

Knoplioch, Jerome. (2015). Systems and methods for comparing different medical images to analyze a structure-of-interest (U.S. Patent No. 8929624). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8929624

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…