The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2015
Filed:
Jan. 21, 2013
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventors:
Tonmoy S. Mukherjee, Atlanta, GA (US);
Arlo J. Aude, Atlanta, GA (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01); H03L 7/095 (2006.01); H04L 7/033 (2006.01); H03L 7/087 (2006.01); H03L 7/089 (2006.01);
U.S. Cl.
CPC ...
H04L 7/0016 (2013.01); H03L 7/095 (2013.01); H04L 7/033 (2013.01); H03L 7/087 (2013.01); H03L 7/0891 (2013.01); H03L 2207/14 (2013.01);
Abstract
The disclosed clock-data recovery architecture includes out-of-lock (including false lock) detection. Out-of-lock detection is accomplished by sampling retimed/recovered data with positive and negative edges of the received data. In example embodiments, an out-of-lock condition is determined either by detecting the occurrence of, or counting, missed edges corresponding to the failure of received data sampling to detect corresponding positive/negative edges of the retimed/recovered data.