The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2015
Filed:
Oct. 09, 2012
Leuze Electronic Gmbh + Co. KG, Owen/Teck, DE;
Horst Essig, Kirchheim/Teck, DE;
Fabian Geiger, Leinfelden-Echterdingen, DE;
Dieter Klass, Frickenhausen, DE;
Juergen-Ralf Weber, Ebersbach, DE;
Leuze Electronic GmbH + Co. KG, Owen/Tuck, DE;
Abstract
A method for optically monitoring an object within a monitoring area includes transmitting light rays with a light transmitting unit that form a line of light on the object. The line of light reflected from the object is imaged on an array of receiving elements that detects the reflected line of light and produces receiving element signals that correspond to measuring points on the object. The receiving element signals are evaluated to structure a distance profile of the object using a triangulation principle. The evaluating includes generating at least one evaluation window which covers in a first direction a local region extending along the line of light and in a second direction a distance range, and using the measuring points located farthest outside within the evaluation window for a left limit point and a right limit point for determining object data.