The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2015
Filed:
May. 16, 2008
Willem Dirk Van Amstel, Geldrop, NL;
Leonard Antonino Cacace, Eindhoven, NL;
Rens Henselmans, Eindhoven, NL;
Willem Dirk Van Amstel, Geldrop, NL;
Leonard Antonino Cacace, Eindhoven, NL;
Rens Henselmans, Eindhoven, NL;
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk Onderzoek TNO, Delft, NL;
Wimoptik B.V., Geldrop, NL;
AC Optomechanix, Eindhoven, NL;
Abstract
In an optical distance sensor for measuring object surfaces with high precision and comprising an objective lens for focusing a measuring beam to a measuring spot on the surfaces, measuring errors due to tilt of an object surface can be detected by using a pupil monitor, which senses the radiation intensity distribution of the reflected measuring beam effectively in the pupil of the objective lens to generate a tilt signal, which can be supplied to a correction/calibration table to obtain a correction signal, which is suitable for correcting the primary distance measuring signal of the sensor. Especially for a differential confocal distance sensor having pinholes arranged in front of radiation-sensitive detectors, a further order of correction can be obtained by determining optimum position and diameter of these pinholes.